I. Miniaturized et Design Design, facillimum facilis et docere
II. Laser deprehensio caput et sample scanning scaena integrari, structuram stabilis et anti-intercessiones fortis
III. Precision Profe positioning fabrica, laser macula Gratia Gratia Gratia tristitia est valde securus
IV. Una axis agit sample ut statim accedat speciem verticaliter, ut tip foramen acus lustravit perpendicularis ad sample
V. Intelligentes acus pascentium modum motricium, dispensata pressurized piezoelectric Ceramic Lorem deprehensio protegit speciem et sample
VI. Lorem optical positioning, non opus est focus, realis-vicis observationis et positioning de probe Sample scanning regio
VII. Spring Suspensio Shockproof modum, simplex et practica, bonum shockproof effectus
VIII. Integrated Scanner Nonlinear disciplinam User Editor, Nanometer characterization et mensuram accuracy melius XCVIII%
Specifications:
| Operating modus | Tangere Modus, ICTUS Modus |
| Libitum modus | Friction / vi lateralis, amplitudine / phase magnetica / electrostatic vis |
| vis curva spectro | FZ vi curva, RMS-z curve |
| Xy scan range | XX * 20um, libitum L * 50um, C * 100um |
| Z scan range | 2.5um, libitum 5um, 10um |
| Scan resolution | Horizontale 0.2nm, vertical 0.05nm |
| Sample magnitudine | Φ≤90mm, h≤20mm |
| Sample Travel Tempus | XV 15mm |
| Optical observationis | 4x optical objective lens / 2.5um resolutio |
| Scan celeritate | 0.6hz, 30hz |
| Scan angulus | 0-360 ° |
| Operating environment | Fenestra XP / VII / VIII / X Operating Ratio |
| Communicationis interface | USB2.0 / 3.0 |
| Inpulsa, absorbing consilio | SPIDUS |
