Docens Microscopium vim atomicam


  • Modus operandi:tactus modus, sonum modus
  • XY, scan range:20*20um, libitum 50*50um, 100*100um
  • Z scan range:2.5um, libitum 5um, 10um
  • Scan senatus:Horizontalis 0.2nm, Verticalis 0.05nm
  • Magnitudine exempli:Φ≤90mm, H≤20mm
  • Specification

    1. subministrata et dissoluta ratio, facillime ferre et docere

    2. Deprehensio laser caput et scaena spectans integrantur, structura valde stabilis est, et anti-expeditio valida est.

    3. Subtilitio specillum positionis fabrica, laser macula noctis temperatio facillima est

    4. Unius axis specimen impellit ad perpendiculum statim accedens, ut extremum acus perpendiculum in sample lustraretur

    5. Sapiens acus pascendi methodum piezoelectricae ceramicae motoris continentis pressurised deprehensio specillum et specimenque automaticum tuetur.

    6. Automatic positio optica, non opus est focus, realis-tempus observationis ac positionis speciminis specimen area intuens

    7. Veris suspensionis shockproofationis modus, simplex et practicus, bonus effectus shockproof

    8. Integrated scanner nonlinear correctione user editor, nanometer characterisation et mensura accurate melius quam XCVIII%

    Formularium:

    Modus operating tactus modus, sonum modus
    Modus libitum Frictio/Lateralis Force, Amplitudo/Phase, Magnetica/Electrostatic Force
    vis spectrum curvae vis curvae FZ, curvae RMS-Z
    XY scan range 20*20um, libitum 50*50um, 100*100um
    Z scan range 2.5um, libitum 5um, 10um
    Scan resolutio Horizontalis 0.2nm, Verticalis 0.05nm
    Magnitudine exempli Φ≤90mm, H≤20mm
    Sample scaena itinerantur 15*15mm
    Optical observationis 4X obiectivum opticum lens/2.5um resolutionis
    Scan celeritate 0.6Hz-30Hz
    Scan angulus 0-360°
    Operans environment Windows XP/7/8/10 systema operandi
    Communication Interface USB2.0/3.0
    Inpulsa-consilium absorbens Intermissa ver

    _20220420173519_副本


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