1.Tintegred Design of Optical Metallographic Microscope et nuclei Force microscopium, potens munera
2.It habet tam optical microscopio et nuclei vis microscope imaging munera, utrumque potest operari simul sine se afficiens invicem
3.at simul, quod habet munera optici duo dimensiva mensurae et nuclei microscopium tres dimensiva mensurae
IV. Laser deprehensio caput et sample scanning scaena integrari, structuram stabilis et anti-intercessiones fortis
V. Precision Profe positioning fabrica laser macula Gratia diei Gratia Gratia tristitia est valde securus
VI. Et una axis coegi sample automatice accedit ad speciem verticaliter, ut tip foramen acus est lustravit perpendicularis ad sample
VII. Et intelligens pascentes modum motricium, imperium pressurized piezoelectric Ceramic automatic deprehensio protegit specillum et sample
VIII. Ultra-High Magnificatio Optical Positioning System ad consequi precise positioning de probe et sample scanning regio
IX. Integrated Scanner Nonlinear disciplinam User Editor, Nanometer characterization et mensuram accuracy melius XCVIII%
Specifications:
| Operating modus | Tangere Modus, ICTUS Modus |
| Libitum modus | Friction / vi lateralis, amplitudine / phase magnetica / electrostatic vis |
| vis curva spectro | FZ vi curva, RMS-z curve |
| Xy scan range | L * 50UM, libitum XX * 20um, C * 100um |
| Z scan range | 5um, libitum 2um, 10um |
| Scan resolution | Horizontale 0.2nm, vertical 0.05nm |
| Sample magnitudine | Φ≤68mm, h≤20mm |
| Sample Travel Tempus | XXV 25mm |
| Optica eyepiece | 10x |
| Optical objective | 5x / 10x / 20x / 50x Plan Apochromatic Proposita |
| Luxuria | Le Köhler lucis ratio |
| Optical focusing | Aspera manual focus |
| Camera | 5MP CMOS sensorem |
| dispono | 10,1 inch plana panel ostentationem cum graph related measurement munus |
| Scan celeritate | 0.6hz, 30hz |
| Scan angulus | 0-360 ° |
| Operating environment | Fenestra XP / VII / VIII / X Operating Ratio |
| Communicationis interface | USB2.0 / 3.0 |
