FCM2000W Computer Type Metallographic Microscope


Specificatio

FCM2000W Introduction

FCM2000W Computer Type Metallographic Microscopium est a trinocular invertitur metallographic microscope, quae est ad identify et analyze compositam structuram ex variis metallis et stagnum materiae. Est late in officinas vel laboratorios demonstra projicientes qualitas idem, rudis materia inspectionem vel post materiam dispensando. Metallographic structure Analysis et investigationis opus in aliqua superficies phaenomena ut superficiem spargit; Metallographic analysis de ferro, non-ferrea metallum materiae, castings, coatings, petrographic analysis de P. et microscopic analysis de componit, Ceramics, etc. in industriae agro efficax est investigationis.

Focusing mechanism

Soundius positus situs et denique-tuning coaxial focusing mechanism est adoptatur, quae adaequatum ad sinistram et dextra latera, denique-tuning praecisione est princeps, ut facilius consequantur simplex et comfortable imago. In crassa temperatio ictu est 38mm, et bene temperatio accurate est 0.002.

Fcm2000w2

Mechanica mobile platform

Tulit magna-scale platform de CLXXX × 155mm et posuit in dextera, quae est in linea cum operatione habitus Ordinarius populo. Per user scriptor operatio, id est convenient ad switch inter focusing mechanism et platform motus, providing users cum magis efficient opus environment.

Fcm2000w3

SYSTRA

EPI-type Kola Illumination ratio cum variabilis aperturae diaphragma et centrum Novifacta agro diaphragm, adoptat adaptive wide voltage 100v-240v, 5w altum claritatem, longa liquaminatur.

FCM2000W4

FCM2000W Configuratione Tabula

Conformatio

Exemplar

Item

Specificatio

Fcm2000w

Optical ratio

Finita Aberrationes Optical System

·

observationis tubo

XLV Die Hastam, trinocular observationis tubo, interpupupillary distantiam temperatio range: 54-75mm, trabem rami rami: LXXX: XX

·

eyepiece

High Oculum Point Large Field Plan Eyepiece PL10x / 18mm

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Altus oculus Point Large Field Plan Eyepiece plings / 18mm, cum micrometer

O

Altus oculus Point Large Field Eyepiece Wf15x / 13mm, cum micrometer

O

Altus oculus Point Large Field Eyepiece Wf20x / 10mm, cum micrometer

O

Objectives (Long Throw Plan Achromatic aliquip)

 

Lmpl5x /0.125 wd15.5mm

·

LMPL10X / 0,25 WD8.7mm

·

LMPL20X / 0.40 WD8.8mm

·

LMPL50X / 0.60 WD5.1MM

·

LMPL100X / 0.80 WD2.00mm

O

converter

Internum positioning quattuor-foraminis converter

·

Internum positus quinque-foraminis converter

O

Focusing mechanism

Coaxial focusing mechanism pro crassum et finem temperatio in humilis manu positus, ad plaga per revolutionem de crassum motus est XXXVIII mm; Et bene temperatio accurate est 0.02 mm

·

Scaena

Tres-layer mechanica mobile suggestus, area 180mmx155mm, dextra manu-low-manus imperium, plaga: 75mm × 40mm

·

opus mensa

Metal Tempus Plate (Center foraminis φ12mm)

·

EPI-illuminatio ratio

EPI-Type Kola dolor, cum variabilis aperturae diaphragma et centrum Novifacta agro diaphragm, Acta Voltage 100v-240v, una 5w calidum color ducitur lux, lux intensionem continuously DUXERIT Lux, lux intensionem continuous

·

EPI-Type Kola Illuminatio ratio, cum variabilis aperturae diaphragmable et centrum Novifacta agro diaphragma, adaptive wide voltage 100v, 240v, 6v30w Halogen Wide 100v, 6v30w Halogen lucerna, lux intensionem continuously continuously

O

Polarizing Accessories

Polarizer Board, fixum Analyzer Board, CCCLX ° Rotating Analyser Board

O

colon

Yellow viridis, hyacintho, frosted Filtra

·

Metallographic Analysis System

Jx2016 Metallographic Analysis Software, III million camera fabrica, 0.5x nibh lens interface, micrometer

·

computatrum

HP Business Jet

O

Nota"· "Latin;"O"Libitum

Jx2016 software

Quod "professional quantitativum metallographic imaginem analysis computatrum operating ratio" figuram a metallographic imaginem analysis system processus et realis-vicis comparationis, deprehenditur, rating de collectis sample maps et output graphic tradit de collected Sample Maps et output Graphic Renuntiationes de Collected Sample Maps et output Graphic Renuntiationes de Collected Sample Maps et output Graphic Renuntiationes de Collected Sample Maps et output Graphic Renuntiationes de Collected Sample Maps. In Software Integrates Hodie Advanced Image Analysis technology, quod est perfecta compositum metallographic microscope et intelligentes analysis technology. DL / DJ / ASTM, etc.). Ratio habet omnes Seres interfaces, quae sunt brevis, patet quod securus agunt. Post simplex disciplina vel referendo ad disciplinam manual, vos can operari illam gratis. Et providet a velox ratio pro doctrina metallographic communi sensu et popularis operationes.

Fcm2000w5

Jx2016 software munera

Image PL | Software: Plus quam decem munera ut imaginem acquisitionem et imaginem repono;

Image Software, magis quam decem munera ut imaginem amplificationem, imaginem etc., etc.;

Imago mensurae software: dozens of mensura munera ut perimeter, area et percentage contentus;

Output Modus: Data Table output, Histogram output, image print output.

Dedicated Metallographic Software Packages:

Frumenti mole mensurae et rating (Frumentum terminus extractionem, frumenti terminus reconstruction, una phase, Dual tempus, frumenti mole mensurae, rating);

Mensurae et rating de non-metallicis inclusions (including sulfides, oxides, silicarium, etc.);

Pearlite et Ferrite contentus mensurae et rating; Dactile ferrum graphite nodularitatem mensurae et rating;

Decarburization layer, carburized iacuit mensurae, superficiem coating crassitudo mensura;

Weld profundum mensurae;

Phase-Area mensurae de Ferricis et Austitititic Aliquam Steels;

Analysis primaria Silicon etutecticus Silicon High Silicon Aluminium Aluminium;

Titanium Alloy Material Analysis ... etc;

Habet metallographic atlases fere DC communiter solebat metallum materiae ad comparationem, occurrens de requisitis maxime unitates metallographic analysis et inspectionem;

In intuitu de continua incremento novum materiae et importari gradu materiae, materiae et iudicium signa quae non intravit in software potest nativus et intravit.

Jx2016 Software Lorem Fenestra Version

Vincere VII Professional, Ultimate Vincere X Professional, Ultimate

Jx2016 software operating gradus

Fcm2000w6

I. Module lectio; II. Hardware parameter lectio; III. Imago acquisition; IV. Field View Electio; V. Aestimatio campester; VI. Generate fama

FCM2000W Configuration Diagram

Fcm2000w7

Fcm2000w magnitudine

Fcm2000w8

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