I. Integrated Design Optical Metallographic Microscope et nuclei Force microscopium, potens munera

II. Hoc est tam optical microscopio et nuclei Force microscopium imaginatione munera, utrumque potest operari simul sine se afficiens se

III. Can operari in Ordinarius aer environment, liquidum environment, temperatus imperium environment et inertes Gas control environment simul

IV. Et sample scanning mensa et laser deprehensionem caput sunt disposito in clausa genus, et specialis Gas potest esse impleta et dimitti intra, sine addendo ad signans operimentum

V. Laser deprehensio verticalis optical iter consilio et potest operari sub liquido cum Gas-liquida dual-propositum specillo possessor

VI. Et una axis coegi sample automatice accedit ad speciem verticaliter, ut tip foramen acus est lustravit perpendicularis ad sample

VII. Et intelligens pascentes modum motricium, imperium pressurized piezoelectric Ceramic automatic deprehensio protegit specillum et sample

VIII. Ultra-High Magnificatio Optical Positioning System ad consequi precise positioning de probe et sample scanning regio

IX. Integrated Scanner Nonlinear disciplinam User Editor, Nanometer characterization et mensuram accuracy melius XCVIII%

Specifications: